Differential interference contrast x-ray microscopy with submicron resolution
نویسندگان
چکیده
Progress in lithography and nanofabrication @E. Di Fabrizio et al., Nature ~London! 401, 895 ~1999!# has made it possible to apply differential interference contrast ~DIC! in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging ~absorption contrast! to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy. © 2001 American Institute of Physics. @DOI: 10.1063/1.1360776#
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